• Intro to TAPs (test access points)
• Resources
• TAPs – Intro to definition and concepts
• TCK (Test Clock) – this signal synchronizes the internal state machine operations.
• TMS – (Test Mode Select) – this signal is sampled at the rising edge of TCK to determine the next state.
• TDI (Test Data In) – this signal represents the data shifted into the device’s test or programming logic. It is sampled at the rising edge of TCK when the internal state machine is in the correct state.
• TDO (Test Data Out) – this signal represents the data shifted out to the devices’s test or programming logic and is valid on the falling edge of TCK when the internal state machine is in the correct state.
• TRST (Test Reset) – this is an option pin which, when available, can reset the TAP controller’s state machine.
• How to utilize RIFF box
• Tabs
• Resurrection – When to use/When not to use
• JTAG – How to acquire data
• DCC – How to read/write data
• Box Service
• Functions
• JTAG read/write – for our purposes, we use this tab to test connections to the riff box. To make sure the connection is successful a boundary scan must be done.
• DCC read/write – used to read memory from the chip.
• Box service – how to update Riff Box and acquire new  firmware
• Troubleshooting Riff Box errors and connection problems